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    • XSTRESS 3000 X-ray stress analyzer, X-ray diffractometer
    • Floor Stand
    • Ring Stand
    • X-Y Unit
    • Table for Electropolishing
    • X-Ray Elastic Constant Determination System
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X-ray residual stress and retained austenite testing equipment

Equipment based on X-ray diffraction and hole-drilling are offered for measuring residual stresses and retained austenite contents.

X-ray stress analyzer (X-ray diffractometer) Xstress 3000 measures the stresses imposed on crystallite material by X-ray, based on the phenomenon known as Braggs Law. A standard Xstress 3000 X-ray stress analyzer (X-ray diffractometer) includes

• main unit
• goniometer G2/G2R or goniometer G3
• software.

Additionally Xstress 3000 can be equipped with

• Floor stand for measuring large and complicated parts
• Ring stand for measuring bearing rings
• X-Y unit for easy stress measurements on the surface area of the part (mapping)
• specially equipped table for electropolishing
• X-ray elastic constant determination system for determining the Effective X-ray Elastic constant

Stresstech Group also offers Prism residual stress system, based on hole-drilling technique, for residual stress measurements. Prism dramatically increases the speed of data acquisition over the traditional strain gage hole-drilling technique of measuring residual stress.