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Xstress 3000 X-ray stress analyzer (X-ray diffractometer) 
| Xstress 3000 G2/G2R | Xstress 3000 G3/G3R |
XSTRESS 3000 is a small, lightweight, accurate and safe X-ray diffractometer for measuring residual stresses and retained austenite contents. XSTRESS 3000 measures the stresses on crystalline material by X-rays, based on the phenomenon known as Bragg´s law. XSTRESS 3000 is suitable for both laboratory and field use. As an easily portable diffractometer it makes measurements possible also in difficult conditions in the field like inside a storage tank, in a pipeline or up on a scaffolding. Despite the portability, the unit´s alignment procedure and use have been designed very much with ease of use in mind, without any loss of accuracy. XSTRESS 3000 is self contained and only requires the 110 - 240 VAC power supply. From the moment it´s been unloaded until it is ready to perform a measurement it takes only 10 min. Thanks to the implementation of the state of the art, patented, semiconductor detector technology the measurement time on a typical steel sample is 2 minutes or less. The accuracy of the measurement using the XSTRESS 3000 is comparable with large stationary laboratory X-ray diffractometers. It is easy to use yet it is so sophisticated that it will satisfy a most demanding researcher. The software, X3000 allows access to all the test parameters and measurement data at any stage of the measurement routine. XSTRESS 3000 consists of the Downloadable files: |
stresstech.fi